Pais’2022

4th International Conference on Pattern Analysis and Intelligent Systems 

October 12-13, 2022

 

Pais’22 Proceedings

Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements.

IEEE Xplore

A Hybrid Conference with both Online and Offline Modes

hosted by the University of Oum El Bouaghi

N e w s:

I N V I T E D    K E Y N O T E    S P E A K E R S :

DR. MOHAMED AMINE FERRAG

PR. LEANDROS MAGLARAS

PR. NASSIRA GHOUALMI-ZINE

DR. ABDELOUAHID DERHAB

PR. MOHAMMED LAMINE KHERFI

Dr. Mourad Bouache

 

– Paper Submission Deadline: July 15, 2022   July 30, 2022

– Acceptance Notification:   August 30, 2022

– Registration Deadline: September 15, 2022  September 20, 2022

– Conference Date: October 12-23, 2022

– National Workshop on Deep Learning and Its Applications : The link

– PAIS’22 Doctoral Consortium: The link

Once again, the International Conference on Pattern Analysis and Intelligent Systems (PAIS) is coming to us from the Oum El Bouaghi University portal, and we hope that the fourth edition will also succeed after the success of the previous editions. Where the first edition was organized at the University of Tebessa in 2015. The second at Khenchela University in 2016 and the third at Tebessa University in 2018. We are pleased to announce the fourth edition to be held over two days, from 12-13 October 2022, with presentations by researchers from the international community, including presentations from keynote speakers and recent lectures.

University of Larbi Ben m'hidi - Oum El Bouaghi - Algeria .

The International Conference on Pattern Analysis and Intelligent Systems would like to become a major point of contact between researchers, engineers, and practitioners from all over the world to share ideas and achievements in the theory and practice of intelligent control, artificial intelligence and decision support concerned with systems, neural networks, soft computing, data mining and knowledge discovery, opinion mining Ontology, machine learning, smart measurement, cloud computing, big data, data science and knowledge, and other modern methods in automated media and technology.